Patent · US Active

Optical position measuring arrangement

US7701593B2 · kind B2 · utility

2Cited by

4References

21Claims

0Family size

Assignee

DR. JOHANNES HEIDENHAIN GMBH · DE

Inventors

Wolfgang Holzapfel · Obing, DE
Walter Huber · Traunstein, DE
Erwin Spanner · Traunstein, DE

Key dates

Filing date	May 7, 2008
Grant date	Apr 20, 2010
Priority date	—
Expiry date	Aug 11, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01D5/38
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An optical position measuring arrangement including a source of illumination that generates one or several bundles of illuminating beams, a measuring graduation that is illuminated by the source of illumination so as to generate a periodic fringe pattern of a defined fringe pattern period and a fiber-optical scanning head, wherein the fiber-optical scanning head scans the periodic fringe pattern. A scanning plate is arranged in the fiber-optical scanning head, wherein the scanning plate is matched to the fringe pattern period and scans the periodic fringe pattern. Fringe patterns, which are phase-shifted in relation to each other, are generated within a fringe pattern period in bundles of partial signal beams in the one or several bundles of illuminating beams via a wavelength-dependent local separation, and the bundles of partial signal beams are employed for conversion into position-dependent phase-shifted scanning signals.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.