Test method and semiconductor device
US7715257B2 · kind B2 · utility
0Cited by
4References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 30, 2007 |
| Grant date | May 11, 2010 |
| Priority date | — |
| Expiry date | Aug 25, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C5/04
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A test method and a semiconductor device is disclosed. One embodiment provides sending out a test signal by a semiconductor device. A reflected signal generated in reaction is compared to the test signal with a first threshold value. The reflected signal is compared with a second threshold value differing from the first threshold value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.