Thorsten Bucksch
17Patents
4h-index
10Co-inventors
53Inventor score
Filing activity: Jul 19, 2001 → May 13, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7180313B2 | Test device for wafer testing digital semiconductor circuits | Physics | 41 | Expired |
| US7330378B2 | Inputting and outputting operating parameters for an integrated semiconductor memory device | Physics | 10 | Active |
| US7421629B2 | Semi-conductor component test device, in particular data buffer component with semi-conductor component test device, as well as semi-conductor component test procedure | Physics | 6 | Expired |
| US7323861B2 | Contact plate for use in standardizing tester channels of a tester system and a standardization system having such a contact plate | Physics | 4 | Expired |
| US7375508B2 | Device and a process for the calibration of a semiconductor component test system | Physics | 4 | Expired |
| US7061260B2 | Calibration device for the calibration of a tester channel of a tester device and a test system | Physics | 4 | Expired |
| US7061227B2 | Apparatus and method for calibrating a semiconductor test system | Physics | 3 | Expired |
| US7184339B2 | Semi-conductor component, as well as a process for the in-or output of test data | Physics | 3 | Expired |
| US6898739B2 | Method and device for testing a memory circuit | Physics | 3 | Expired |
| US7415649B2 | Semi-conductor component test device with shift register, and semi-conductor component test procedure | Physics | 3 | Expired |
| US6754869B2 | Method and device for testing set-up time and hold time of signals of a circuit with clocked data transfer | Physics | 2 | Expired |
| US7317323B2 | Signal test procedure for testing semi-conductor components and a test apparatus for testing semi-conductor components | Physics | 0 | Expired |
| US6750670B2 | Integrated test circuit | Physics | 0 | Expired |
| US10438680B2 | Non-volatile memory testing | Physics | 0 | Active |
| US11456646B2 | Neural network circuitry for motors | Electricity | 0 | Active |
| US11556097B2 | Neural network circuitry for motors with first plurality of neurons and second plurality of neurons | Electricity | 0 | Active |
| US7715257B2 | Test method and semiconductor device | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.