Moment-based method and system for evaluation of metal layer transient currents in an integrated circuit
US7716620B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 6, 2007 |
| Grant date | May 11, 2010 |
| Priority date | — |
| Expiry date | Jun 14, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/367
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A moment-based method and system for evaluation of metal layer transient currents in an integrated circuit provides a computationally efficient evaluation of transient current magnitudes through each interconnect in the metal layer. The determinable magnitudes include peak, rms and average current, which can be used in subsequent reliability analyses. Interconnect path nodes are traversed and circuit moments are either retrieved from a previous interconnect delay analysis or are computed. For each pair of nodes, current moments are computed from the circuit moments. The average current is computed from the zero-order circuit moment and the peak and rms currents are obtained from expressions according to a lognormal or other distribution shape assumption for the current waveform at each node.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.