Ying Liu
73Patents
8h-index
115Co-inventors
77Inventor score
Filing activity: Jun 27, 2002 → Feb 28, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7925661B2 | Method and system for information processing using meta-archives | Physics | 71 | Expired |
| US6842714B1 | Method for determining the leakage power for an integrated circuit | Physics | 46 | Expired |
| US7397259B1 | Method and apparatus for statistical CMOS device characterization | Physics | 13 | Active |
| US7346867B2 | Method for estimating propagation noise based on effective capacitance in an integrated circuit chip | Physics | 13 | Expired |
| US7526515B2 | Method and system for a grid-enabled virtual machine with movable objects | Emerging Cross-Sectional Technologies | 13 | Active |
| US7408372B2 | Method and apparatus for measuring device mismatches | Physics | 10 | Active |
| US6731129B1 | Apparatus for measuring capacitance of a semiconductor device | Physics | 9 | Expired |
| US8484212B2 | Providing reconstructed data based on stored aggregate data in response to queries for unavailable data | Physics | 8 | Active |
| US7647577B2 | Editing, creating, and verifying reorganization of flowchart, and transforming between flowchart and tree diagram | Physics | 8 | Active |
| US10057186B2 | Service broker for computational offloading and improved resource utilization | Electricity | 8 | Active |
| US8266556B2 | Fracturing continuous photolithography masks | Physics | 6 | Active |
| US7441213B2 | Method for testing the validity of initial-condition statements in circuit simulation, and correcting inconsistencies thereof | Physics | 6 | Active |
| US7716620B2 | Moment-based method and system for evaluation of metal layer transient currents in an integrated circuit | Physics | 5 | Active |
| US6963637B2 | Methods, systems, and media to capture a redialing sequence and to redial | Electricity | 5 | Expired |
| US8245159B2 | Gradient based search mechanism for optimizing photolithograph masks | Physics | 5 | Active |
| US8217671B2 | Parallel array architecture for constant current electro-migration stress testing | Physics | 4 | Active |
| US9229691B2 | Method and apparatus for programming assistance | Physics | 4 | Active |
| US8266580B2 | Editing, creating, and verifying reorganization of flowchart, and transforming between flowchart and tree diagram | Physics | 3 | Active |
| US10185925B2 | Generating business rule model | Physics | 3 | Active |
| US8661291B2 | Diagnosing a fault incident in a data center | Physics | 3 | Active |
| US6807659B2 | Robust delay metric for RC circuits | Physics | 3 | Expired |
| US7496552B2 | Method for rule compliance situation checking and related checking system | Physics | 3 | Active |
| US8407632B2 | Detecting dose and focus variations during photolithography | Physics | 3 | Active |
| US8056049B2 | Method and system for analyzing and presenting conflicts in model transformation and automatically reconciling model transformation | Physics | 3 | Active |
| US8208481B2 | Determination of packet loss locations | Electricity | 3 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.