(Al,Ga,In)N and ZnO direct wafer bonded structure for optoelectronic applications, and its fabrication method
US7719020B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jun 16, 2006 |
| Grant date | May 18, 2010 |
| Priority date | — |
| Expiry date | Dec 20, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10H20/825
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
An (Al, Ga, In)N and ZnO direct wafer bonded light emitting diode (LED), wherein light passes through electrically conductive ZnO. Flat and clean surfaces are prepared for both the (Al, Ga, In)N and ZnO wafers. A wafer bonding process is then performed between the (Al, Ga, In)N and ZnO wafers, wherein the (Al, Ga, In)N and ZnO wafers are joined together and then wafer bonded in a nitrogen ambient under uniaxial pressure at a set temperature for a set duration. After the wafer bonding process, ZnO is shaped for increasing light extraction from inside of LED.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.