Patent · US Active

(Al,Ga,In)N and ZnO direct wafer bonded structure for optoelectronic applications, and its fabrication method

US7719020B2 · kind B2 · utility

20Cited by
13References
20Claims
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Key dates

Filing dateJun 16, 2006
Grant dateMay 18, 2010
Priority date
Expiry dateDec 20, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10H20/825
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

An (Al, Ga, In)N and ZnO direct wafer bonded light emitting diode (LED), wherein light passes through electrically conductive ZnO. Flat and clean surfaces are prepared for both the (Al, Ga, In)N and ZnO wafers. A wafer bonding process is then performed between the (Al, Ga, In)N and ZnO wafers, wherein the (Al, Ga, In)N and ZnO wafers are joined together and then wafer bonded in a nitrogen ambient under uniaxial pressure at a set temperature for a set duration. After the wafer bonding process, ZnO is shaped for increasing light extraction from inside of LED.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.