Probe assembly arrangement
US7737714B2 · kind B2 · utility
3Cited by
17References
15Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Nov 5, 2008 |
| Grant date | Jun 15, 2010 |
| Priority date | — |
| Expiry date | Nov 5, 2028 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49147
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A probe array is assembled on a probe card platform. Each of the probes in the probe array has a probe base that includes a gripping handle. The probe bases have two or more different shapes. The probe bases of different shapes are interleaved such that any two adjacent probes on the platform have probe bases of different shapes. The arrangement of the probes increases effective spacing between the probes to facilitate the maneuvering of a handling tool.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.