Tester for testing semiconductor device
US7739572B2 · kind B2 · utility
2Cited by
17References
13Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jul 25, 2007 |
| Grant date | Jun 15, 2010 |
| Priority date | — |
| Expiry date | May 6, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/56008
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A tester for testing a semiconductor device is disclosed. The tester for testing the semiconductor device employs a data selector for converting a logical test pattern data transmitted from a pattern generator into a physical test pattern data and an expected data based on the logical test pattern data, thereby generating various timings based on a time delay instead of using a plurality of clocks to improve a test efficiency and reduce a manufacturing cost.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.