Patent · US Active

Prober for testing magnetically sensitive components

US7741860B2 · kind B2 · utility

4Cited by

3References

12Claims

0Family size

Assignee

SUSS MicroTec Test Systems GmbH · DE

Inventors

Sebastian Giessmann · Großenhain, DE
Stefan Kreissig · Drebach, DE
Stojan Kanev · Sacka, DE

Key dates

Filing date	Jun 24, 2008
Grant date	Jun 22, 2010
Priority date	—
Expiry date	Jul 3, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG11C2029/5602
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A prober for testing components comprises a lower frame, over which a probe holder plate is disposed at a distance therefrom for receiving test probes that make contact with the components to be tested and to which a displacement device is connected. A substrate carrier is disposed in the space between the frame and the probe holder plate, and the probe holder plate is provided with an opening, below which the substrate carrier can be displaced. To expand the scope of application of probers used for testing components, all those components of the prober that surround the substrate are made from a non-magnetic material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.