Patent · US Active

Test apparatus for the testing of electronic components

US7741861B2 · kind B2 · utility

2Cited by

6References

7Claims

0Family size

Assignee

Multitest Elektronische Systeme GmbH · DE

Inventors

Maximilian Schaule · Mindelheim, DE
Manuel Petermann · Rosenheim, DE
Stefan Kurz · Frankfurt, DE
Andeas Nagy · Birkenfeld, DE

Key dates

Filing date	Mar 29, 2007
Grant date	Jun 22, 2010
Priority date	—
Expiry date	Aug 11, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2863
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In the case of a test apparatus for testing electronic components which are present in an assembly, in particular in the form of strips, a slide-like contacting board supporting device, to which the contacting board can be fastened, is mounted on the test head. The contacting board supporting device can be moved parallel to the plane of the contacting board when the contacting nest is docked on the test head, with the result that the contacting board can be brought into different test positions which are laterally beside one another.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.