Manuel Petermann
3Patents
1h-index
6Co-inventors
33Inventor score
Filing activity: Mar 29, 2007 → Jan 9, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7741861B2 | Test apparatus for the testing of electronic components | Physics | 2 | Active |
| US9671428B2 | Contact spring for a testing base for the high current testing of an electronic component | Physics | 0 | Active |
| US10156588B2 | Contact tip and contact element and method of producing the same | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.