Patent · US Active

Integrated device for simplified parallel testing, test board for testing a plurality of integrated devices, and test system and tester unit

US7752510B2 · kind B2 · utility

0Cited by

3References

5Claims

0Family size

Assignee

Qimonda AG · DE

Inventors

Manfred Proell · Dorfen, DE
Stephan Schroeder · Munich, DE
Wolfgang Ruf · Friedberg, DE
Hermann Haas · Grevesmühlen, DE

Key dates

Filing date	Mar 9, 2007
Grant date	Jul 6, 2010
Priority date	—
Expiry date	Nov 19, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/31935
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An integrated device comprises a functional circuit, a test circuit for testing the functional circuit and for providing an error data item and a register element for storing the error data item and for outputting the error data item at an error data output of the integrated device responsive to an output signal. The register element is connected to a data input of the integrated device in order to accept a data item, which is applied to the data input, responsive to the output signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.