Stephan Schroeder
16Patents
4h-index
19Co-inventors
53Inventor score
Filing activity: Apr 17, 1998 → Mar 30, 2012
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5929338A | Thickness measurement of in-ground culverts | Physics | 67 | Expired |
| US7877649B2 | Method and apparatus for testing a memory chip using a common node for multiple inputs and outputs | Physics | 7 | Active |
| US6914837B2 | DRAM memory with a shared sense amplifier structure | Physics | 7 | Expired |
| US7206238B2 | Integrated semiconductor memory comprising at least one word line and method | Physics | 4 | Expired |
| US9937009B2 | Torque-limiting assembly for a surgical powertool | Human Necessities | 3 | Active |
| US6906972B2 | Integrated DRAM semiconductor memory and method for operating the same | Physics | 3 | Expired |
| US6639861B2 | Integrated memory and method for testing an integrated memory | Physics | 3 | Expired |
| US7846996B2 | Polymer concentrates with improved processability | Chemistry; Metallurgy | 2 | Active |
| US6970389B2 | Integrated memory | Physics | 1 | Expired |
| US7710810B2 | Device for refreshing memory contents | Physics | 0 | Active |
| US6965535B2 | Integrated semiconductor memory circuit and a method for operating the same | Physics | 0 | Expired |
| US7110310B2 | RAM store and control method therefor | Physics | 0 | Expired |
| US7248536B2 | Integrated semiconductor memory and method for operating an integrated semiconductor memory | Physics | 0 | Expired |
| US7512023B2 | Memory and method for improving the reliability of a memory having a used memory region and an unused memory region | Physics | 0 | Active |
| US7402859B2 | Field effect semiconductor switch and method for fabricating it | Electricity | 0 | Expired |
| US7752510B2 | Integrated device for simplified parallel testing, test board for testing a plurality of integrated devices, and test system and tester unit | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.