Broadband optical metrology with reduced wave front distortion, chromatic dispersion compensation and monitoring
US7755775B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 3, 2006 |
| Grant date | Jul 13, 2010 |
| Priority date | — |
| Expiry date | Mar 4, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/956
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and method for examining a sample with a broadband radiation while preserving a small spot and low wave front distortion. The apparatus has a broadband source for generating the broadband radiation and a first reflective optics that employ toroidal mirrors that are barrel or donut-shaped and may be placed in a crossed or parallel arrangement for producing a broadband test beam that is guided to the sample such that it is incident on it at a small spot. A sampling aperture is provided for filtering a certain center portion from the broadband test beam. A second reflective optics is provided for shaping a reflected response beam from the broadband radiation that is reflected from the spot. The response beam is delivered by second reflective optics to a detector for examination. The apparatus and method can be applied to improve wave front distortion in reflectance measurements and for performing transmittance measurements with chromatic distortion compensation. The method and apparatus further provide for efficient monitoring of the broadband test beam.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.