Method and apparatus for dynamically determining tester recipes
US7774670B2 · kind B2 · utility
2Cited by
5References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 11, 2007 |
| Grant date | Aug 10, 2010 |
| Priority date | — |
| Expiry date | Oct 16, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31721
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method includes retrieving a group test parameter determined based on test results associated with a plurality of integrated circuit devices. A particular integrated circuit device is tested using a test program and the group test parameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.