Patent · US Active

Resist composition, method of forming resist pattern, compound and acid generator

US7776510B2 · kind B2 · utility

12Cited by
8References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 9, 2008
Grant dateAug 17, 2010
Priority date
Expiry dateJun 9, 2028

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S430/123
  • WIPO fieldOrganic fine chemistry
  • WIPO sectorChemistry

Abstract

A compound represented by general formula (b-14); and acid generator consisting of the compound; and a resist composition including a base component (A) which exhibits changed solubility in an alkali developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, the acid-generator component (B) including an acid generator (B1) consisting of a compound represented by general formula (b1-14):wherein R7″ to R9″ each independently represents an aryl group or an alkyl group, wherein two of R7″ to R9″ may be bonded to each other to form a ring with the sulfur atom, and at least one of R7″ to R9″ represents a substituted aryl group in which a portion or all of the hydrogen atoms are substituted with an alkoxyalkyloxy group or an alkoxycarbonylalkyloxy group; and X− represents an anion.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.