Method and apparatus for electrical testing
US7777509B2 · kind B2 · utility
2Cited by
13References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 25, 2008 |
| Grant date | Aug 17, 2010 |
| Priority date | — |
| Expiry date | Apr 25, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06772
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test apparatus and device under test has a probe that can be located very close to contact pads and that requires very few solder connections. In addition, the probe can be configured to meet any appropriate and desired electrical specification while still using a same circuit board. There is no need to attach discrete components to a circuit board. Thus, by using a configurable probe, a single circuit board may be used with multiple probes or a reconfigurable probe to test for compliance with a variety of different electrical specifications having different requirements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.