Patent · US Active

Test stage for a carrier having printhead integrated circuitry thereon

US7786723B2 · kind B2 · utility

0Cited by

14References

7Claims

0Family size

Assignee

Silverbrook Research Pty Ltd · AU

Inventors

David Burke · Chatswood, AU
Stephen John Sleijpen · Sydney, AU
Jan Waszczuk · Sydney, AU
Joseph Tharion · Sydney, AU

Key dates

Filing date	Aug 19, 2008
Grant date	Aug 31, 2010
Priority date	—
Expiry date	Sep 16, 2028

Classification

Technology area (CPC B)Performing Operations; Transporting
CPC primaryB41J29/393
WIPO fieldTextile and paper machines
WIPO sectorMechanical engineering

Abstract

This invention provides for a test stage for a printhead integrated circuit tester for testing operation of printhead integrated circuits mounted on a carrier. The test stage includes a support structure. A fixture is arranged on the support structure and is configured to receive and locate the carrier. A clamping mechanism is arranged on the fixture. The clamping mechanism has at least one clamp assembly for clamping the carrier to the test stage. A controller controls operation of the clamping mechanism.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.