Joseph Tharion
9Patents
1h-index
10Co-inventors
37Inventor score
Filing activity: Aug 19, 2008 → Jun 5, 2011
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8006967B2 | Cradle assembly for a pressure decay leak tester | Physics | 2 | Active |
| US8689612B2 | Pressure tester for printhead integrated circuit carrier | Physics | 1 | Active |
| US7971472B2 | Leak tester for a carrier for printhead integrated circuitry | Physics | 1 | Active |
| US7880900B2 | Measuring apparatus for performing positional analysis on an integrated circuit carrier | Performing Operations; Transporting | 0 | Active |
| US7987699B2 | Pneumatic assembly for a pressure decay tester | Physics | 0 | Active |
| US7789477B2 | Method for testing integrity of a base for printhead integrated circuitry | Performing Operations; Transporting | 0 | Active |
| US7786723B2 | Test stage for a carrier having printhead integrated circuitry thereon | Performing Operations; Transporting | 0 | Active |
| US7924440B2 | Imaging apparatus for imaging integrated circuits on an integrated circuit carrier | Physics | 0 | Active |
| US7984640B2 | Pressure-based tester for a platform assembly | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.