Patent · US Active

Method for testing integrity of a base for printhead integrated circuitry

US7789477B2 · kind B2 · utility

0Cited by

5References

6Claims

0Family size

Assignee

Silverbrook Research Pty Ltd · AU

Inventors

Stephen John Sleijpen · Sydney, AU
Joseph Tharion · Sydney, AU
Jan Waszczuk · Sydney, AU
Eric Patrick O'Donnell · Sydney, AU
William Granger · Sydney, AU
David Bernardi · Chatswood, AU
Stephen Richard O'Farrell · Sydney, AU
Jason Mark Thelander · Chatswood, AU

Key dates

Filing date	Aug 19, 2008
Grant date	Sep 7, 2010
Priority date	—
Expiry date	Dec 6, 2028

Classification

Technology area (CPC B)Performing Operations; Transporting
CPC primaryB41J2/175
WIPO fieldTextile and paper machines
WIPO sectorMechanical engineering

Abstract

Provided is a method for testing integrity of a base for printhead integrated circuits. The base has at least one fluid inlet in fluid communication with a plurality of fluid outlets via discrete fluid paths. The method includes the steps of engaging the, or each, fluid inlet of the base to a fluid supply in a sealing manner, charging the base with pressurized fluid until a predetermined pressure is reached, and monitoring the pressure in the base for a predetermined period of time, wherein a rate of pressure decay is indicative of an integrity of the base.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.