Patent · US Active

Methods and apparatus for cleaning chamber components

US7789969B2 · kind B2 · utility

3Cited by
78References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 31, 2007
Grant dateSep 7, 2010
Priority date
Expiry dateOct 31, 2027

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC23C16/4407
  • WIPO fieldChemical engineering
  • WIPO sectorChemistry

Abstract

In a first aspect, a method for cleaning a semiconductor fabrication chamber component having an orifice is provided. The method includes (A) placing the component into a bath having a cleaning solution; (B) flowing a fluid into the orifice thereby maintaining at least a first portion of the orifice free from cleaning solution while the cleaning solution cleans the component; and (C) withdrawing the fluid from the orifice such that cleaning solution enters into the first portion of the orifice and cleans the first portion of the orifice. Numerous other aspects are also provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.