Dimensional measurement probe
US7792654B2 · kind B2 · utility
6Cited by
0References
11Claims
0Family size
Assignee
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Key dates
| Filing date | May 8, 2006 |
| Grant date | Sep 7, 2010 |
| Priority date | — |
| Expiry date | Dec 14, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/012
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe for measuring the dimensions of objects on a coordinate positioning machine such as a machine tool has a workpiece-contacting stylus 20. This is suspended via a sensor mechanism 30, including strain gauges 34 which provide an output when the stylus contacts a workpiece. A processor 16 processes the strain gauge outputs to produce a trigger signal. It does so in accordance with an algorithm or equation or look-up table which ensures equal sensitivity in all possible directions of approach to the workpiece in the three dimensions X, Y, Z.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.