Method and system of modeling leakage
US7793239B2 · kind B2 · utility
8Cited by
5References
3Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 24, 2006 |
| Grant date | Sep 7, 2010 |
| Priority date | — |
| Expiry date | Dec 5, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/367
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system of modeling power leakage for a design comprises providing one or more cell libraries comprising parameters for particular device characteristics and providing a module configured to determine of cell leakages of a device for a PVT corner. In determining the cell leakage, the module uses the device characteristics contained in the one or more cell libraries, in combination with one or more components at a PVT for a predetermined application and an amount of devices in a leakage path (Fckt) and a leakage distribution (Fchip). There is no need to recharacterize the one or more cell libraries.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.