Patent · US Active

Method for precisely measuring position of a part to be inspected at a part inspection station

US7796278B2 · kind B2 · utility

30Cited by
38References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 19, 2008
Grant dateSep 14, 2010
Priority date
Expiry dateDec 31, 2028

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/245
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for precisely measuring position of a part to be inspected at a part inspection station is provided. The method includes positioning a part having a part axis relative to a measurement axis at the part inspection station and scanning the positioned part with an array of planes of radiation so that the part occludes each of the planes of radiation over a measurement interval of the part to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part. The method also includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals and processing the measurement signals to obtain a geometric measurement between the axes at the measurement interval. The geometric measurement may be a distance between the axes or angle between the axes. If the geometric measurement is outside an acceptable range of geometric values, the method may further include repositioning the part until the geometric measurement between the axes at the measurement interval is w…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.