Eric M. Walstra
2Patents
2h-index
1Co-inventors
27Inventor score
Filing activity: Sep 19, 2008 → Apr 20, 2011
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7796278B2 | Method for precisely measuring position of a part to be inspected at a part inspection station | Physics | 30 | Active |
| US8390826B2 | Method and system for optically inspecting parts | Physics | 18 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.