Apparatus and method for testing electrical interconnects
US7800385B2 · kind B2 · utility
2Cited by
2References
20Claims
0Family size
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Key dates
| Filing date | Mar 13, 2008 |
| Grant date | Sep 21, 2010 |
| Priority date | — |
| Expiry date | Jul 30, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2808
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test system including a package with interconnect paths. The package may have electrical paths that are electrically connected by the interconnect paths. The electrically connected electrical paths may yield increased data without significantly increasing the required testing hardware.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.