Common centroid electrostatic discharge protection for integrated circuit devices
US7812674B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 25, 2008 |
| Grant date | Oct 12, 2010 |
| Priority date | — |
| Expiry date | Feb 12, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D89/10
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A method of protecting a circuit design implemented within an integrated circuit (IC) from electrostatic discharge (ESD) can include positioning a device array pair comprising first and second device arrays on the IC to share a common centroid, wherein the first and second device arrays are matched. An ESD diode array pair comprising first and second ESD diode arrays can be positioned on the IC adjacent to a first perimeter encompassing the first and second device arrays, wherein the first and second ESD diode arrays share the common centroid and are matched. A cathode terminal of each ESD diode of the first ESD diode array can be coupled to an input of the first device array, and a cathode terminal of each ESD diode of the second ESD diode array can be coupled to an input of the second device array.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.