High-speed signal testing system having oscilloscope functionality
US7813297B2 · kind B2 · utility
6Cited by
52References
24Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jul 12, 2007 |
| Grant date | Oct 12, 2010 |
| Priority date | — |
| Expiry date | Aug 29, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3193
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A high-speed signal testing system that includes a digital circuitry for providing a pattern tester with oscilloscope functionality at minimal implementation cost. The digital circuitry includes a time-base generator that provides a high-speed repeating time-base signal. The time-base signal, in conjunction with a sub-sampler and an accumulation memory, allows the system to zoom in on, and analyze portions of, one or more bits of interest in a repeating pattern present on the signal under test. Such portions of interest include rising and falling edges and constant high and low bit values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.