DFT Microsystems, Inc.
7Patents
5Active
7Granted
40Portfolio score
Filing activity: May 3, 2004 → Mar 9, 2011 · 4 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7315574B2 | System and method for generating a jittered test signal | Physics | 9 | Expired |
| US7681091B2 | Signal integrity measurement systems and methods using a predominantly digital time-base generator | Physics | 8 | Active |
| US7242209B2 | System and method for testing integrated circuits | Physics | 6 | Expired |
| US7813297B2 | High-speed signal testing system having oscilloscope functionality | Physics | 6 | Active |
| US7917319B2 | Systems and methods for testing and diagnosing delay faults and for parametric testing in digital circuits | Physics | 5 | Active |
| US8327204B2 | High-speed transceiver tester incorporating jitter injection | Electricity | 4 | Active |
| US8244492B2 | Methods of parametric testing in digital circuits | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.