Multi-frequency image processing for inspecting parts having complex geometric shapes
US7817845B2 · kind B2 · utility
3Cited by
16References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 29, 2006 |
| Grant date | Oct 19, 2010 |
| Priority date | — |
| Expiry date | Jul 8, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/44
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for detecting small cracks and other anomalies on parts having complex geometries is disclosed. The method includes eddy current inspection incorporating collection of data from multi-frequency eddy current signals. Phase analysis is used to combine the multi-frequency data to enhance the signal to noise ratio of the raw inspection image. The image is then reprocessed using a spatiotemporal filter to correlate with the frequency components of the eddy current flaw signal to separate signals associated with cracks and other flaws at edges that would ordinarily be hidden by edge effect signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.