Method, device and program for setting a reference value for substrate inspection
US7822566B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 28, 2007 |
| Grant date | Oct 26, 2010 |
| Priority date | — |
| Expiry date | May 26, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05K13/083
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Where substrates with components are produced through a series of production processes and inspected after each of these production processes, a method is provided for setting an optimum reference value for making judgments in these inspections such that the frequency of occurrence of disagreement between inspection results after an intermediate process and after the final results will come to within a specified range. After an initial value is assigned for a reference value, this value is sequentially varied while repeating specified processes of saving measured and judgment data on inspected portions of components in a memory and setting a reference value by using the data saved in the memory until a specified condition becomes satisfied.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.