Kiyoshi Murakami
14Patents
5h-index
13Co-inventors
63Inventor score
Filing activity: Aug 31, 1995 → Nov 23, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6947151B2 | Surface state inspecting method and substrate inspecting apparatus | Physics | 20 | Expired |
| US7394084B2 | Method of generating image and illumination device for inspecting substrate | Physics | 13 | Expired |
| US5674914A | Method and apparatus for reclamation of waste polyvinyl chloride | Emerging Cross-Sectional Technologies | 7 | Expired |
| US7310406B2 | Inspection method and system for and method of producing component mounting substrate | Physics | 6 | Expired |
| US7114249B2 | Substrate inspecting method and substrate inspecting apparatus using the method | Emerging Cross-Sectional Technologies | 5 | Expired |
| US7505149B2 | Apparatus for surface inspection and method and apparatus for inspecting substrate | Physics | 5 | Expired |
| US7512260B2 | Substrate inspection method and apparatus | Physics | 3 | Active |
| US8351682B2 | X-ray examination region setting method, X-ray examination apparatus and X-ray examination region setting program | Physics | 2 | Active |
| US11180065B2 | Beverage container holding device | Performing Operations; Transporting | 2 | Active |
| US9783131B2 | Decorated molded article | Performing Operations; Transporting | 0 | Active |
| US9552803B2 | Communication method, communication system, and magnetic resonance apparatus | Electricity | 0 | Active |
| US7822566B2 | Method, device and program for setting a reference value for substrate inspection | Electricity | 0 | Active |
| US7680320B2 | Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection data | Physics | 0 | Active |
| US7869644B2 | Methods of and apparatus for inspecting substrate | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.