Apparatus for testing electronic devices
US7826995B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 14, 2006 |
| Grant date | Nov 2, 2010 |
| Priority date | — |
| Expiry date | Sep 2, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2877
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention provides an apparatus for testing an integrated circuits on devices including a plurality of electrical subassemblies including a plurality of pattern generator, driver, and power boards divided into physical zones with each physical zone including one pattern generator board, at least one driver board, and at least one power board connected to one another; and a configuration file having information representing flow of current through the electrical subassemblies connected to one another in an interconnection scheme, wherein the electrical subassemblies are organized into at least one logical zone, and wherein the logical zone comprises a plurality of pattern generators.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.