Jitter spectrum analysis using random sampling (RS)
US7844022B2 · kind B2 · utility
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Key dates
| Filing date | Oct 31, 2006 |
| Grant date | Nov 30, 2010 |
| Priority date | — |
| Expiry date | Jul 19, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L1/205
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present subject matter is directed to methodologies for measuring jitter spectral content in a sampled signal using continuous time interval analyzers (CTIA) for characterization and test of clock signals and high-speed digital interfaces. The methodology takes advantage of anti-aliasing aspects of random sampling (RS) in a time interval error (TIE) based analysis methodology by randomizing timing of samples relative to signal edges and/or intervals between signal edges.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.