X-ray diffractometer having co-exiting stages optimized for single crystal and bulk diffraction
US7848489B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 2, 2009 |
| Grant date | Dec 7, 2010 |
| Priority date | — |
| Expiry date | Jun 6, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/207
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A diffractometer for X-ray diffraction measurements has two co-exiting sample stages which are mounted on the goniometer base simultaneously. A rotation stage is used for single crystal X-ray diffraction and an XYZ stage is used for general X-ray diffraction with bulky samples. The driving bases of both stages are located away from the instrument center so the measuring space in the vicinity of the instrument center is available to either of the two sample stages. With this arrangement, the rotation axis of the rotation stage stays aligned to the instrument center even when the XYZ stage is used for data collection. Therefore, realigning of the rotation stage to the instrument center is not necessary when switching the applications between the two stages.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.