Test-device system for independent characterization of sensor-width and sensor-stripe-height definition processes
US7852072B2 · kind B2 · utility
1Cited by
2References
20Claims
0Family size
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Key dates
| Filing date | Dec 31, 2007 |
| Grant date | Dec 14, 2010 |
| Priority date | — |
| Expiry date | Jun 5, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B5/455
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A test-device system and method for deconvoluting measurements of effects of a sensor-width definition process from measurements of effects of a sensor-stripe-height-definition process in a manufacture of a magnetic sensor. The test-device system comprises a first test device for generating data to characterize a sensor-width-definition process. The test-device system also comprises a second test device for generating data to characterize a sensor-stripe-height-definition process. The test-device system allows independent characterization of a sensor-width parameter and a sensor-stripe-height parameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.