Patent · US Active

Division-based sensing and partitioning of electronic memory

US7852669B2 · kind B2 · utility

3Cited by
4References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 16, 2007
Grant dateDec 14, 2010
Priority date
Expiry dateApr 5, 2028

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2211/5634
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Providing distinction between overlapping threshold levels of one or more multi-cell memory devices is described herein. By way of example, a system can include a sensing component that can measure a level associated with a first memory cell. The system can also include a comparison component that can compare the measured level associated with the first memory cell level to non-overlapping threshold levels, wherein such measurement can be used to determine a unique bit level associated with a second memory cell. By way of further example, methodologies are described for accurately measuring a bit level of a first cell of a dual-cell memory device, by comparing a second cell value to non-overlapping threshold values, as measured with respect to the second reference point.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.