Test components fabricated with large area sensors used for determining the resistance of an MR sensor
US7855553B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 27, 2007 |
| Grant date | Dec 21, 2010 |
| Priority date | — |
| Expiry date | Jan 7, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2220/2516
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Test methods and components are disclosed for testing resistances of magnetoresistance (MR) sensors in read elements. Test components are fabricated on a wafer with a first test lead, a test MR sensor, and a second test lead. The test leads and test MR sensor are fabricated with similar processes as first shields, MR sensors, and second shields of read elements on tie wafer. However, the test MR sensor is fabricated with an area that is larger than areas of the MR sensors in the read elements. The larger area of the test MR sensor causes the resistance of the test MR sensor to be insignificant compared to the lead resistance. Thus, a resistance measurement of the test component represents the lead resistance of a read element. An accurate resistance measurement of an MR sensor in a read element may then be determined by subtracting the lead resistance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.