Polarimetric Raman system and method for analysing a sample
US7859661B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jan 19, 2007 |
| Grant date | Dec 28, 2010 |
| Priority date | — |
| Expiry date | Jun 5, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/4792
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A Raman method and system for analysing a sample including an excitation source emitting an incident light beam, a sample holder for mounting the sample, elements for focusing the incident light beam onto the sample surface to generate a Raman scattered light having an intensity, elements for collecting the Raman scattered light to form a Raman scattered light beam, a detection system measuring intensity of the Raman scattered light beam as a function of time. The system includes at least a polarization state generator able to generate four independent polarization states or a polarization state analyzer able to analyze four independent polarization states to detect the intensity of the Raman scattered light beam and calculate a partial or complete Mueller-Stokes matrix of the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.