Patent · US Active

Setup and hold time characterization device and method

US7861200B2 · kind B2 · utility

0Cited by
14References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 24, 2008
Grant dateDec 28, 2010
Priority date
Expiry dateFeb 21, 2029

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/3312
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method of characterizing a device under test (DUT) includes determining a goal function associated with a setup and hold time for the DUT. A minimum value for the goal function is determined by iteratively adjusting setup and hold times for input data to the DUT, and determining whether the DUT performs according to specifications. The minimum goal function value will reflect minimum setup and hold time values based on weights associated with the goal function. This allows the minimum setup and hold times for the DUT to be characterized with a small number of binary searches, improving the speed of the characterization process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.