Calibration method and apparatus
US7866056B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 18, 2008 |
| Grant date | Jan 11, 2011 |
| Priority date | — |
| Expiry date | Feb 18, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B21/042
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method is described for calibrating apparatus including a measurement probe mounted on a machine, such as a machine tool. The machine is arranged to capture machine position data indicative of the position of the measurement probe and the measurement probe is arranged to capture probe data indicative of the position of a surface relative to the measurement probe. The measurement probe may be an analogue or scanning probe having a deflectable stylus. The first step of the method involves moving the measurement probe at a known speed relative to an artefact whilst capturing probe data and machine position data. In particular, the measurement probe is moved along a path that enables probe data to be captured that is indicative of the position of two or more points on the surface of the artefact relative to the measurement probe. A second step of the method comprises analyzing the machine position data and the probe data and determining from that data the relative delay in capturing probe data and machine position data (i.e. the so-called system delay).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.