Method and apparatus for detecting multiple anomalies in a cluster of components
US7870440B2 · kind B2 · utility
7Cited by
3References
23Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 14, 2008 |
| Grant date | Jan 11, 2011 |
| Priority date | — |
| Expiry date | Jul 18, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/008
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system that detects multiple anomalies in a cluster of components is presented. During operation, the system monitors derivatives obtained from one or more inferential variables which are received from sensors in the cluster of components. The system then determines whether one or more components within the cluster have experienced an anomalous event based on the monitored derivatives. If so, the system performs one or more remedial actions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.