Method and apparatus for testing data converter
US7880650B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 30, 2008 |
| Grant date | Feb 1, 2011 |
| Priority date | — |
| Expiry date | Oct 24, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/804
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A data converter for converting analog signals to digital signals, or for converting digital signals to analog signals is provided. In one embodiment, a production self-test is provided. In one embodiment, a high-speed lower-resolution method or mode for a data converter is provided. In one embodiment, a differential data converter with a more stable comparator common mode voltage is provided. In one embodiment, the input range of a digitally calibrated data converter is provided and maintained so that there is no loss in input range due to the calibration. In one embodiment, digital post-processing of an uncalibrated result using a previously stored calibration value is provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.