Patent · US Active

Method for measuring crystallite size with a two-dimensional X-ray diffractometer

US7885383B1 · kind B1 · utility

4Cited by
4References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 3, 2009
Grant dateFeb 8, 2011
Priority date—
Expiry dateAug 1, 2029

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N23/205
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Crystallite size in a sample is determined by performing a quantitative γ-profile analysis on a diffraction ring in a two-dimensional X-ray diffraction pattern. In particular, a two-dimensional X-ray diffraction system is first calibrated with a sample having a known crystallite size, crystal structure and X-ray absorption coefficient. For a given instrument window, the number of grains contributing to a selected diffraction ring is determined by the effective diffraction volume, grain size and the multiplicity of the diffracting crystal planes. The grain size of an unknown sample can then be determined by a quantitative analysis of the diffraction ring.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.