Patent · US Active

Testing to prescribe state capture by, and state retrieval from scan registers

US7886263B1 · kind B1 · utility

5Cited by

1References

19Claims

0Family size

Assignee

Cadence Design Systems, Inc. · US

Inventors

Senthil Arasu Thirunavukarasu · Rawatsar, IN
Vivek Chickermane · Ithaca, US
Shaleen Bhabu · New Delhi, IN

Key dates

Filing date	Dec 10, 2007
Grant date	Feb 8, 2011
Priority date	—
Expiry date	Mar 29, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/318583
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

State retention cells of a test circuit embedded in an electrical circuit are interconnected to form one or more scan chains. The scan chains are interconnected so that unknown states, or X-states, are shifted through the scan chains in an order other than the order in which the states were captured by the state retention cells of the scan chain. Such reordering of response states in individual scan chains may be used to align the X-states across multiple scan chains to achieve higher test compression scan register circuit testing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.