Patent · US Active

Method for measuring a workpiece using a machine tool

US7886453B2 · kind B2 · utility

11Cited by
6References
32Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 11, 2007
Grant dateFeb 15, 2011
Priority date—
Expiry dateFeb 26, 2028

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T83/0405
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method is described for measuring a workpiece on a machine tool using an analogue probe having a deflectable stylus. The method comprises the step of taking a workpiece having a nominal surface profile, the workpiece being located within the working area of the machine tool. The machine tool is used to move the analogue probe along a predetermined (known) measurement path relative to the workpiece whilst deflection of the stylus is measured. The analogue probe is moved relative to the workpiece at a speed greater than five millimeters per second and the predetermined measurement path is selected to provide intermittent contact between the stylus and the workpiece.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.