Transistor structures and methods for making the same
US7888207B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 5, 2007 |
| Grant date | Feb 15, 2011 |
| Priority date | — |
| Expiry date | Mar 4, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D99/00
Abstract
Enhancement mode, field effect transistors wherein at least a portion of the transistor structure may be substantially transparent. One variant of the transistor includes a channel layer comprising a substantially insulating, substantially transparent, material selected from ZnO or SnO2. A gate insulator layer comprising a substantially transparent material is located adjacent to the channel layer so as to define a channel layer/gate insulator layer interface. A second variant of the transistor includes a channel layer comprising a substantially transparent material selected from substantially insulating ZnO or SnO2, the substantially insulating ZnO or SnO2 being produced by annealing. Devices that include the transistors and methods for making the transistors are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.