Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same
US7888932B2 · kind B2 · utility
2Cited by
41References
11Claims
0Family size
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Key dates
| Filing date | Nov 5, 2007 |
| Grant date | Feb 15, 2011 |
| Priority date | — |
| Expiry date | Aug 4, 2028 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of assembling an eddy current array probe to facilitate nondestructive testing of a sample is provided. The method includes positioning a plurality of differential side mount coils at least partially within a flexible material. The method also includes coupling the flexible material within a tip portion of the eddy current array probe, such that the flexible material has a contour that substantially conforms to a portion of a surface of the sample to be tested.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.