Method and apparatus for storing failing part locations in a module
US7890819B2 · kind B2 · utility
1Cited by
125References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 19, 2007 |
| Grant date | Feb 15, 2011 |
| Priority date | — |
| Expiry date | Jul 11, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/4402
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A non-volatile storage device on a memory module comprising a plurality of memory devices is used to store the locations of defective parts on the memory module, such as data query (“DQ”) terminals, identified during a testing procedure. After testing, the non-volatile storage device, such as an electrically erasable programmable read only memory (“EEPROM”), may be accessed to determine specific memory devices such as dynamic random access memory (“DRAM”) which need to be repaired or replaced rather than re-testing the specific memory module.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.