Method and apparatus for enhanced probe card architecture
US7893701B2 · kind B2 · utility
1Cited by
6References
29Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Apr 29, 2009 |
| Grant date | Feb 22, 2011 |
| Priority date | — |
| Expiry date | Aug 14, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31903
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A technique for distributing power to a plurality of dies uses a probe card. The probe card can include a plurality of regulators, each regulator accepting a bulk power input and producing a regulated output. The regulated output can be controlled by a programmable controller that accepts a tester-controlled power input and adjusts the regulated outputs as a function of the tester-controlled power input.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.